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US 12,638,499 B2Granted
Testing of microelectronics device and method
AssigneeNokomis, Inc.
InventorsTodd Eric Chornenky, James Robert Uplinger, II, Andrew Richard Portune, Walter J. Keller, III
Life of this patent
Estimating the term…
Abstract
A device and method to test microelectronic parts to determine whether the parts are compromised by active illumination in a testing fixture by analysis of emission metrics.
Claims15
A testing fixture for testing a microelectronic part specimen under test (PSUT), the testing fixture comprising:
- at least one capacitive member having two capacitive plates;
- radio frequency (RF) voltage supplies of opposite phases connected to each capacitive plate;
- and
- an insulating guide plate positioned above the two capacitive plates, the insulating guide plate including a cavity, the cavity configured to receive a part specimen under test (PSUT), the insulating guide plate being further configured to spatially register the PSUT in a position relative to the two capacitive plates.
1 more element
A testing fixture, comprising:
- a printed circuit board;
- an input connector with leads mounted on a surface of the printed circuit board;
- a first layer positioned on the surface of the printed circuit board and connected to the leads;
- and
- a second layer positioned above the first layer, the second layer including an insulating guide plate with at least one cut-out.
2 more elements
A testing fixture, comprising:
- a printed circuit board;
- an input connector mounted on the printed circuit board;
- ground and radio frequency (RF) leads connected to and extending from the input connector;
- two capacitive plates positioned, at a distance from each other, on the printed circuit board, the two capacitive plates being connected to ground and RF leads;
- and
- an insulating guide plate positioned above the two capacitive plates, the insulating guide plate including a cavity, the cavity configured to receive a part specimen under test (PSUT) and spatially register the PSUT in a position relative to the two capacitive plates.
3 more elements
Dependencies are inferred from the claim text.