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US 12,633,508 B2Granted
Ion detector and analyzer
AssigneeHamamatsu Photonics K.K.
InventorsJunichi Kondo, Takeshi Endo
Life of this patent
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Abstract
An ion detector includes a conversion dynode including a conversion region where electrons are emitted by incident ions, an electron multiplier including an electron incident surface on which the electrons are incident, and an aperture electrode including an aperture through which the electrons traveling from the conversion region to the electron incident surface pass. The conversion region is a region protruding toward a space where the electrons are emitted.
Claims11
An ion detector comprising:
- a conversion dynode including a conversion region where electrons are emitted by incident ions;
- an electron multiplier including an electron incident surface on which the electrons are incident;
- and
- an aperture electrode including an aperture through which the electrons traveling from the conversion region to the electron incident surface pass, wherein
- the conversion region is a region protruding toward a space where the electrons are emitted.
2 more elements
Dependencies are inferred from the claim text.