Magnetic lenses, charged particle microscope systems including the same, and associated methods
AssigneeFEI Company
InventorsJan Stopka, Tomáš Radlička, Martin Oral
Life of this patent
Estimating the term…
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AssigneeFEI Company
InventorsJan Stopka, Tomáš Radlička, Martin Oral
Estimating the term…
Magnetic lenses, charged particle microscope systems including the same, and associated methods. In an example, a magnetic lens is configured to direct a charged particle beam to a sample location and comprises a plurality of pole pieces and at least two independent coils. The magnetic lens operates as an objective lens with variable main objective plane without immersing a sample in a magnetic field. The variable main objective plane permits selective adjustment of a magnification of the charged particle beam at the focal plane without immersing the sample location in the magnetic fields produced by coils of the magnetic lens. In an example, a charged particle microscope system comprises a charged particle source, a sample holder, and a magnetic objective lens. In an example, a method comprises positioning a sample relative to a magnetic lens and operating the magnetic lens to focus a charged particle beam to a focus location.
An apparatus, comprising:
A magnetic lens comprising:
A charged particle microscope system comprising:
A method, comprising:
Dependencies are inferred from the claim text.