Electron beam apparatus, foil or grid lens, and method of operating an electron beam apparatus
AssigneeICT Integrated Circuit Testing Gesellschaft für Halbleiterprüftechnik mbH
InventorPieter Kruit
Life of this patent
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AssigneeICT Integrated Circuit Testing Gesellschaft für Halbleiterprüftechnik mbH
InventorPieter Kruit
Estimating the term…
An electron beam apparatus (100) is described, including an electron source (105) configured to generate a primary electron beam propagating along an optical axis (A), a sample stage (108) configured to support a sample, an objective lens (120) configured to focus the primary electron beam on the sample for causing an emission of a signal electron beam and a foil or grid lens (300, 400) for influencing the signal electron beam. The foil or grid lens includes an electrode (340) that surrounds the optical axis; and a first foil or grid (320) adjacent to the electrode and perpendicular to the optical axis, the first foil or grid being substantially transparent to electrons, wherein a central opening (325) configured to allow the primary electron beam to pass through the central opening is provided in the first foil or grid.
An electron beam apparatus, comprising:
A foil or grid lens for influencing an electron beam propagating through the foil or grid lens along an optical axis, comprising:
A method of operating an electron beam apparatus having a foil or grid lens, the foil or grid lens having a first foil or grid arranged adjacent to an electrode, the method comprising:
An electron beam apparatus, comprising:
Dependencies are inferred from the claim text.