Repairing defective columns of compute-in-memory and near-memory computing devices

A method of performing operations using a compute-in-memory device including

• (i) control circuits providing N input data elements and M redundancy input data elements, N and M being integers greater than zero, (ii) multiplier circuits configured to multiply the N input data elements by N stored data elements and provide a multiplier output, and (iii) redundancy multiplier circuits configured to multiply the M redundancy input data elements by M stored redundant data elements and provide a redundancy multiplier output, the method comprising:
• providing the N input data elements to the multiplier circuits;
• and
• providing the M redundancy input data elements with a value of zero as an input data element to the redundancy multiplier circuits, such that the redundancy multiplier circuits provide a redundancy multiplier output of zero, regardless of a value of the M stored redundant data elements.

A compute-in-memory device, comprising:

• control circuits providing N input data elements and M redundancy input data elements, N and M being integers greater than zero;
• multiplier circuits configured to (i) multiply the N input data elements by N stored data elements and (ii) provide a multiplier output;
• and
• redundancy multiplier circuits configured to (i) multiply the M redundancy input data elements by M stored redundant data elements and (ii) provide a redundancy multiplier output, wherein the control circuits include logic to execute operations including, responsive to an indication of a defective column in a memory array storing stored data elements:
• providing, to a redundancy multiplier circuit of the redundancy multiplier circuits, a value of a particular input data element originally allocated to a multiplier circuit, of the multiplier circuits, connected to the defective column;
• and
• providing a value of zero as an input data element to the multiplier circuit connected to the defective column, such that the multiplier circuit connected to the defective column provides a multiplier output of zero for the defective column, regardless of a value of a stored data element of the defective column.