Abnormality degree calculation system and abnormality degree calculation method
AssigneeHitachi, Ltd.
InventorsKota Dohi, Takashi Endo, Yohei Kawaguchi
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AssigneeHitachi, Ltd.
InventorsKota Dohi, Takashi Endo, Yohei Kawaguchi
Estimating the term…
An abnormality degree calculation system includes a concept classification assignment unit that assigns a predetermined concept classification based on an identification number of a target device, a feature value vector extraction unit that extracts a feature value vector based on sensor data of a sensor corresponding to the target device, a likelihood calculation unit that calculates a likelihood of the feature value vector by using a machine learning model obtained from a learning database, a loss calculation unit that calculates a loss using a loss function as a function of the likelihood, a model update unit that updates the model by using the loss and a model, a re-learning necessity determination unit that determines whether re-learning is necessary from the calculated likelihood when an abnormality of the target device is detected, and an abnormality degree calculation unit that calculates an abnormality degree when the re-learning is unnecessary.
An abnormality degree calculation system that calculates an abnormality degree of a target device, the abnormality degree calculation system comprising:
An abnormality degree calculation method for calculating an abnormality degree of a target device by a computer, the abnormality degree calculation method comprising:
Dependencies are inferred from the claim text.