Electronic device for detecting defect and operation method thereof

An operation method of an electronic device comprising a plurality of processing lanes and at least one additional processing lane, wherein the at least one additional processing lane comprises physical or logical circuity having a same structure as that of the plurality of processing lanes, and the operation method comprising:

• identifying a lane group including lanes to process identical input data among a plurality of lanes including the plurality of processing lanes and the at least one additional processing lane;
• identifying, for each of a plurality of lane groups, comparison result data indicating a result of comparison between processing result data of lanes included in each lane group;
• and
• detecting whether a defect occurs for at least one of the plurality of lanes based on the comparison result data of the plurality of lane groups, wherein
• when a defect occurs for at least one of the plurality of lanes, the method further comprising controlling the at least one of the plurality of lanes in which the defect occurs to be deactivated and controlling input data to be processed by remaining lanes of the plurality of processing lanes or the at least one additional processing lane in which there is a lack of the defect.