X-ray inspection apparatus and method of inspection with X-rays
AssigneeHitachi High-Tech Analysis Corporation
InventorsToshiyuki Takahara, Tsuneo Sato, Satoshi Matsubara, Yuta Seki, Kazuya Iwata
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AssigneeHitachi High-Tech Analysis Corporation
InventorsToshiyuki Takahara, Tsuneo Sato, Satoshi Matsubara, Yuta Seki, Kazuya Iwata
Estimating the term…
Proposed are an X-ray inspection apparatus and a method of inspection with X-rays in which even in a sample having coated portion and uncoated portion of the cathode material, the inspection of foreign objects in the both portions can be simultaneously performed under the same conditions. The X-ray inspection apparatus includes an X-ray source (2) that irradiates the sample (S) with X-rays (X1), an X-ray detection unit (3) which is installed at a side opposite to the X-ray source with respect to the sample and detects the X-rays that passed through the sample, and a filter (4) installed between the X-ray source and the X-ray detection unit, wherein the sample has a region with a large amount of X-ray absorption and a region with a small amount of X-ray absorption.
An X-ray inspection apparatus comprising:
A method of inspection with X-rays comprising:
Dependencies are inferred from the claim text.