Self calibration formal inspection system and method of using it to inspect article
AssigneesTyco Electronics (Shanghai) Co., Ltd., TE Connectivity Solutions GmbH, AMP Amermex, S.A. de C.V.
InventorsLei (Alex) Zhou, Dandan (Emily) Zhang, Roberto Francisco-Yi Lu, Rong Zhang, Angel Alberto Slistan, Jorge Enrique Clayton, Sonny O Osunkwo, Jiankun (Jerry) Zhou, Xianghao (Jorge) Bao
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