Element analysis device, mounting jig, and mounting method
AssigneeHoriba, Ltd.
InventorsTakahito Inoue, Hiroshi Uchihara, Yasushi Hirata
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AssigneeHoriba, Ltd.
InventorsTakahito Inoue, Hiroshi Uchihara, Yasushi Hirata
Estimating the term…
In order to provide an elemental analysis device that includes an electrode having a housing recess where a crucible is housed during an elemental analysis, and that is capable of making only the part of a consumed electrode tip replaceable, an elemental analysis device including a first electrode and a second electrode between which a crucible MP containing a sample is nipped, and that heats the sample by applying a current between the first electrode and the second electrode, the first electrode includes: a first electrode main body that is provided with a housing recess where the crucible MP is housed; and a first electrode tip that is provided removably to the first electrode main body in such a manner that a part thereof is exposed inside the housing recess.
An elemental analysis device that includes a first electrode and a second electrode between which a crucible containing a sample is nipped, and that heats the sample by applying a current between the first electrode and the second electrode, wherein
A first electrode tip for an element analysis device for an elemental analysis device having a first electrode and a second electrode between which a crucible containing a sample is nipped, the first electrode having a first electrode main body, the first electrode tip comprising:
Dependencies are inferred from the claim text.