US 12,629,109 B2 · Material decomposition calibration for x-ray imaging systems

Abstract

An X-ray imaging system, such as a computed tomography (CT) computed tomography (CT) imaging system is provided for material decomposition calibration and intended for use with a calibration phantom. The X-ray imaging system comprises an X-ray source configured to emit X-rays and an X-ray detector arranged in the X-ray beam path configured to generate detector data. The calibration phantom is located in the X-ray beam path. The X-ray imaging system further comprises an X-ray beam limiting device including at least one calibration element in the X-ray beam path. The X-ray imaging system also comprises image processing circuitry configured to acquire projection data for a set of projections based on the detector data, and to determine pathlengths through at least one material of the at least one calibration element and at least one material of the calibration phantom, at least partly based on acquired projection data, for performing material decomposition calibration.

Claims25

Dependent claims

An X-ray imaging system configured for material decomposition calibration, and intended for use with a calibration phantom, the X-ray imaging system comprising:

an X-ray source configured to emit X-rays;
an X-ray detector arranged in the X-ray beam path and configured to generate detector data;
wherein the calibration phantom is located in the X-ray beam path between the X-ray source and the X-ray detector;
an X-ray beam limiting device arranged in the X-ray beam path in proximity to the X-ray source, wherein the X-ray beam limiting device comprises at least one calibration element for arrangement in the X-ray beam path, wherein the X-ray beam limiting device is part of a pre-patient collimator arranged in connection with the X-ray source;
and
image processing circuitry configured to acquire projection data for a set of projections based on the detector data, and to determine pathlengths through at least one material of the at least one calibration element and at least one material of the calibration phantom, at least partly based on acquired projection data, for performing material decomposition calibration.

3 more elements

A method for material decomposition calibration of an X-ray imaging system having an X-ray source configured to emit X-rays, an X-ray detector, an X-ray beam limiting device arranged in the X-ray beam path in proximity to the X-ray source, and image processing circuitry, wherein the X-ray beam limiting device comprises at least one calibration element, the method comprising:

placing a calibration phantom in the X-ray beam path of the X-ray imaging system, between the X-ray beam limiting device and the X-ray detector;
initiating a calibration sequence;
acquiring projection data for a set of projections based on the output of the X-ray detector;
determining pathlengths through at least one material in the at least one calibration element and at least one material in the calibration phantom, at least partly based on acquired projection data;
and
performing material decomposition calibration at least partly based on the determined pathlengths
wherein acquiring projection data comprises:
rotating the calibration phantom, instead of the X-ray source, the X-ray detector and the X-ray beam limiting device, to a number of predefined angles at which it stops, and allowing the X-ray detector to generate a detector response at each stop;
and
wherein the acquired projection data is at least partly based on the detector response.

7 more elements

Dependencies are inferred from the claim text.

Material decomposition calibration for x-ray imaging systems

Life of this patent

Material decomposition calibration for x-ray imaging systems

Life of this patent

Abstract

Claims25