Measurement system, measurement method, measurement device, and program
AssigneeNTT, Inc.
InventorsKei Kuwabara, Kenichi Matsunaga, Takayuki Ogasawara
Life of this patent
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AssigneeNTT, Inc.
InventorsKei Kuwabara, Kenichi Matsunaga, Takayuki Ogasawara
Estimating the term…
A measurement system includes a measurement unit configured to perform measurement a plurality of times on the basis of a first clock signal having a first clock period to obtain a plurality of measurement results, a time stamp provision unit configured to provide a time stamp indicating a measurement time to each measurement result obtained in the second period among the plurality of measurement results obtained using the measurement unit the basis of a second clock signal having a second clock period longer than the first clock period and having better period accuracy than the first clock signal, and a measurement time correction unit configured to correct a measurement time of a measurement result in accordance with a period specified using two time stamps and the number of measurement results obtained during the period.
A measurement system, comprising:
A measurement method, comprising:
A non-transitory computer readable storage medium storing a program causing a computer which acquires a plurality of measurement results obtained by performing measurement a plurality of times on a first basis of a first clock signal having a first clock period and a time stamp indicating a measurement time provided to each of two or more of the plurality of measurement results on a second basis of a second clock signal having a second clock period, to function as:
Dependencies are inferred from the claim text.