Test device and test system comprising same

A test device comprising:

• a first substrate including a data conversion module having a first connector for receiving data acquired from an external equipment, an FPGA (Field Programmable Gate Array) for converting the received data, and a second connector for outputting the converted data;
• a second substrate having a test module including a third connector connected to the second connector of the first substrate and receiving the converted data, a test unit for performing a test operation using the data received through the third connector, a communication unit for transmitting test result information according to a test operation result of the test unit to an outside, and a control unit for controlling the test unit and the communication unit;
• and
• a housing for accommodating the first substrate and the second substrate,
• wherein if the communication unit is set as a slave, the test result information is transmitted to a first destination, and if the communication unit is set as a master, the test result information is transmitted to a second destination different from the first destination.