Method and assistance system for checking samples for defects
AssigneeSiemens Aktiengesellschaft
InventorsSilvio Becher, Felix Buggenthin, Johannes Kehrer, Ingo Thon, Stefan Hagen Weber
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AssigneeSiemens Aktiengesellschaft
InventorsSilvio Becher, Felix Buggenthin, Johannes Kehrer, Ingo Thon, Stefan Hagen Weber
Estimating the term…
A method for checking samples for defects is provided, in which image data of the samples are recorded and classified into predeterminable defect categories by a defect detection algorithm, and the samples classified into a defect category are represented in a multi-dimensional confusion matrix as a classification result of the defect detection algorithm, characterized in that miniature images which reproduce the image data are assigned according to the classified defect categories of the image data to segments of the confusion matrix which represent the defect categories, and these miniature images are displayed visually, the miniature image is assigned by an interaction with a user or a software robot to a different segment from the assigned segment of the confusion matrix, and is either provided as training image data for the defect detection algorithm or is output as training image data for the defect detection algorithm.
A method for checking samples for defectiveness, the method comprising:
An assistance system for checking samples for defectiveness by a defect recognition device, which records image data of the samples to be checked and classifies the image data associated with the samples into predefinable defect categories by a defect recognition algorithm, wherein a number of the samples classified in the defect categories are presentable in a multi-dimensional confusion matrix as a classification result of the defect recognition algorithm, the assistance system comprising:
Dependencies are inferred from the claim text.