Systems, apparatus and methods for remote visual inspection
AssigneeIMRANDD Ltd.
InventorsChristopher Blake, Innes Auchterlonie
Life of this patent
Estimating the term…
Abstract
Apparatus and method for visual inspection of a target structure. The apparatus comprises a plurality of cameras for capturing imaging data, the imaging data comprising a plurality of images of the target structure, wherein a first camera of the plurality of cameras is configured to collect the imaging data in a first wavelength range and a second camera configured to collect the imaging data in a second wavelength range, the second wavelength range being a different range of wavelengths to the first wavelength range. At least two of the cameras of the plurality of cameras collect imaging data of the target structure from different angles. The apparatus further comprises a processing unit configured to process the imaging data.
Claims16
An apparatus for visual inspection of a target structure, the apparatus comprising:
- a plurality of cameras for capturing imaging data, the imaging data comprising a plurality of images of the target structure, wherein a first camera of the plurality of cameras is configured to collect the imaging data in a first wavelength range and a second camera configured to collect the imaging data in a second wavelength range, the second wavelength range being a different range of wavelengths to the first wavelength range;
- wherein the visual inspection is of a predetermined parameter of the target structure, and
- wherein the first wavelength range and the second wavelength range are selected based on the predetermined parameter of the target structure;
- and
- wherein at least two of the cameras of the plurality of cameras collect imaging data of the target structure from different angles;
- and
- a processing unit configured to process the imaging data.
A system for visual inspection of a target structure, comprising:
- one or more apparatus configured to be securely attached to the target structure,
- wherein a first apparatus includes a plurality of cameras;
- wherein a first camera in the plurality of cameras collect the imaging data in a first wavelength range;
- wherein a second camera configured to collect the imaging data in a second wavelength range;
- wherein the second wavelength range being a different range of wavelengths to the first wavelength range;
- wherein the first wavelength range and the second wavelength range are selected based on a predetermined parameter of the target structure;
- and
- wherein at least two of the cameras of the plurality of cameras collect imaging data of the target structure from different angles;
- and
- a central unit configured to receive imaging data from the apparatus, and analyze the imaging data to perform the visual inspection of the target structure.
A method for visual inspection of a target structure by a visual inspection system comprising an apparatus attached to the target structure and a central unit, the method comprising:
- capturing, by a plurality of cameras of the apparatus, imaging data comprising a plurality of images of the target structure, wherein:
- a first camera in the plurality of cameras collect the imaging data in a first wavelength range;
- a second camera configured to collect the imaging data in a second wavelength range;
- the second wavelength range being a different range of wavelengths to the first wavelength range;
- the first wavelength range and the second wavelength range are selected based on a predetermined parameter of the target structure;
- and
- at least two of the cameras of the plurality of cameras collect imaging data of the target structure from different angles;
- collecting, by a processing unit of the apparatus, the imaging data;
- transmitting, by a connectivity module, the collected imagining data to the central unit;
- receiving, by the central unit, the collected imaging data;
- and
- analyzing, by the central unit, the collected imaging data to perform visual inspection of the target structure, wherein the visual inspection is of the predetermined parameter of the target structure.
Dependencies are inferred from the claim text.