A simulation method of performing a simulation analysis on a full chip system, wherein the full chip system comprises a package structure, a printed circuit board and a system on a chip (SoC), and the simulation method comprises steps of:
- (a):
- generating a signal channel model corresponding to each of a plurality of input/output power domains based on design layouts of the package structure and the printed circuit board;
- (b):
- generating a system power transmission model based on the design layouts of the package structure and the printed circuit board, and the distributions of the power supply nodes on a layout of the SoC;
- (c):
- establishing an interface connection circuit model for each of the input/output power domains, wherein each of the interface connection circuit models comprises a transmitter, the signal channel model corresponding to the transmitter, a receiver, a current measurement point and a voltage measurement point, wherein in each of the plurality of interface connection circuit models, two ends of the signal channel model are connected to the transmitter and the receiver, respectively, and the transmitter comprises a data input terminal, a clock terminal and an input/output power terminal, the current measurement point is disposed on the input/output power terminal, and the voltage measurement point is disposed on a connection part between the signal channel model and the receiver;
- (d):
- simulating a current step response of the current measurement point of each of the interface connection circuit models, by a simulation program with integrated circuit emphasis (SPICE), to generate a first current time-domain model corresponding to the each of the interface connection circuit models;
- (e):
- generating a second current time-domain model based on a response of the first current time-domain model corresponding to each of the plurality of interface connection circuit models at the current measurement point when the data input terminal receives random data;
- when the data input terminal of the first current time-domain model corresponding to each of the plurality of interface connection circuit models receives the random data,
- comparing a current data bit and a previous data bit in the random data, to obtain an interface data change corresponding to each of the plurality of first current time-domain models, wherein when the current data bit is the same as the previous data bit, a current of the current measurement point of the first current time-domain model is zero;
- generating the second current time-domain model corresponding to each of the plurality of first current time-domain models, based on the first current time-domain model corresponding to each of the plurality of interface connection circuit models, and the current step response of the current measurement point of each of the plurality of first current time-domain models and the interface data change corresponding to each of the plurality of first current time-domain models
- (f):
- generating a third current time-domain model based on a current change of each of the power supply nodes of a digital circuit corresponding to a digital power domain;
- (g):
- connecting the system power transmission model, each of the plurality of second current time-domain models, and each of the plurality of third current time-domain models, to generate a complete power transmission model and obtain a power noise generated by the complete power transmission model after the complete power transmission model obtains a supply current;
- (h):
- recording a clock signal outputted from a phase lock loop, wherein the phase lock loop is connected to each of the plurality of interface connection circuit models;
- (i):
- simulating a sensitivity of each of plurality of interface connection circuit models to power by the SPICE based on the transmission of the clock signal outputted by the phase lock loop, to obtain jitter time-domain information of each of the plurality of interface connection circuit models under the power noise;
- (j):
- simulating a voltage step response of the voltage measurement point of each of the plurality of interface connection circuit models when the clock terminal receives an ideal signal, by the SPICE, to generate a first voltage time-domain model;
- and
- (k):
- generating a system waveform corresponding to each of the interface connection circuit models based on the jitter time-domain information of each of the plurality of interface connection circuit models under the power noise, the first voltage time-domain model corresponding to each of the plurality of interface connection circuit model, and transmission of the data in each of interface connection circuit models, to further obtain an eye diagram and a time-domain jitter distribution corresponding to each of the plurality of interface connection circuit models.