Universal socket test card
AssigneeHewlett Packard Enterprise Development LP
InventorsMin-Huang Wu, Heriberto Castillo Velez
Life of this patent
Estimating the term…
Abstract
Systems and methods are provided for testing sockets, such as but not limited to CPU and GPU sockets. Systems and methods disclosed herein utilize a test card that has a test component and an adaptor Printed Circuit Board. The adaptor Printed Circuit Board (PCB) is configured to connect with a corresponding socket type on a motherboard and serves as an interface between the test component and a socket of the corresponding socket type. The test component includes logic that simulates a test function to test the socket. By connecting the test card to a socket using the adaptor PCB, the socket can be tested by simulating the test function on the test card.
Claims20
A test card, comprising:
- a test component comprising logic configured to simulate a test function to test a plurality of socket types;
- and
- an adaptor Printed Circuit Board (PCB) comprising a first surface that is configured to be inserted into a corresponding socket type on a motherboard, wherein the adaptor PCB serves as an interface between the test component and a socket of the corresponding socket type,
- wherein the test component is connected to a second surface of the adaptor PCB opposite the socket, and wherein the test component simulates a test function to test the socket.
A method, comprising:
- connecting a first surface of an adaptor Printed Circuit Board (PCB), corresponding to a socket type of a plurality of socket types, to a socket on a motherboard;
- connecting a test component to the socket by connecting the test component to a second surface of the adaptor PCB, wherein the test component comprises logic that simulates a test function to test the plurality of socket types;
- and
- performing the test function to test the socket using the test component connected to the adaptor PCB by executing the logic that simulates the test function.
A central processing unit (CPU) socket test apparatus, comprising:
- a test module comprising logic programed to perform a test function on a plurality of CPU socket types;
- and
- an adaptor component comprising a first surface and a second surface opposite the first surface, the first surface is configured to be electrically connected to the test module, the second surface comprises a vertical connector that corresponds to a CPU socket type of the plurality of CPU socket types and is configured to serve as an interface between the test module and a CPU socket of the corresponding CPU socket type.
Dependencies are inferred from the claim text.