Electronic device, parameter calibration method, and non-transitory computer readable storage medium
AssigneeHTC Corporation
InventorWei-Fan Chen
Life of this patent
Estimating the term…
Abstract
An electronic device is disclosed. The electronic device includes several sensing circuits, several strain sensing circuits, a memory and a processor. The several sensing circuits are configured to obtain several sensing values. The several strain sensing circuits are configured to obtain several strain sensing values. The memory is configured to store a linking database. The linking database includes a linking relationship between several testing strain sensing value groups and several testing external parameter groups in correspondence. The processor is configured to: update several external parameters between the several sensing circuits according to the several strain sensing values and the linking database.
Claims20
An electronic device, comprising:
- a plurality of sensing circuits, configured to obtain a plurality of sensing values so as to obtain a pose of the electronic device within an environmental coordinate system of a real space;
- a plurality of strain sensing circuits, configured to obtain a plurality of strain sensing values in correspondence to a deformation of the electronic device;
- a memory, configured to store a linking database, wherein the linking database comprises a linking relationship between a plurality of testing strain sensing value groups of the plurality of strain sensing circuits and a plurality of testing external parameter groups of the plurality of sensing circuits in correspondence;
- and
- a processor, coupled to the plurality of sensing circuits, the plurality of strain sensing circuits and the memory, configured to:
- update a plurality of external parameters between the plurality of sensing circuits according to the plurality of strain sensing values and the linking database so as to obtain the pose of the electronic device within the environmental coordinate system accurately, wherein when obtaining the pose of the electronic device, the plurality of external parameters between the plurality of sensing circuits are considered.
A parameter calibration method, suitable for an electronic device, comprising:
- obtaining a plurality of sensing values so as to obtain a pose of the electronic device within an environmental coordinate system of a real space by a plurality of sensing circuits of the electronic device;
- obtaining a plurality of strain sensing values in correspondence to a deformation of the electronic device by a plurality of strain sensing circuits of the electronic device;
- storing a linking database by a memory of the electronic device, wherein the linking database comprises a linking relationship between a plurality of testing strain sensing value groups of the plurality of strain sensing circuits and a plurality of testing external parameter groups of the plurality of sensing circuits in correspondence;
- and
- updating a plurality of external parameters between the plurality of sensing circuits by a processor of the electronic device according to the plurality of strain sensing values and the linking database so as to obtain the pose of the electronic device within the environmental coordinate system accurately, wherein when obtaining the pose of the electronic device, the plurality of external parameters between the plurality of sensing circuits are considered.
A non-transitory computer readable storage medium, wherein the non-transitory computer readable storage medium comprises one or more computer programs stored therein, and the one or more computer programs can be executed by one or more processors so as to be configured to operate a parameter calibration method, wherein the parameter calibration method comprises:
- obtaining a plurality of sensing values so as to obtain a pose of an electronic device within an environmental coordinate system of a real space by a plurality of sensing circuits of the electronic device;
- obtaining a plurality of strain sensing values in correspondence to a deformation of the electronic device by a plurality of strain sensing circuits of the electronic device;
- storing a linking database by a memory of the electronic device, wherein the linking database comprises a linking relationship between a plurality of testing strain sensing value groups of the plurality of strain sensing circuits and a plurality of testing external parameter groups of the plurality of sensing circuits in correspondence;
- and
- updating a plurality of external parameters between the plurality of sensing circuits by a processor of the electronic device according to the plurality of strain sensing values and the linking database so as to obtain the pose of the electronic device within the environmental coordinate system accurately, wherein when obtaining the pose of the electronic device, the plurality of external parameters between the plurality of sensing circuits are considered.
Dependencies are inferred from the claim text.