Semiconductor device and operating method using temperature-compensated pass permission bits

An operating method of a semiconductor device, the operating method comprising:

• performing a program operation;
• providing a program pulse to a selected word line;
• sensing memory cells to which the program pulse has been provided through a plurality of bit lines;
• and
• comparing a number of memory cells that have been programmed successfully, among the memory cells, in the sensing of the memory cells, and a pass permission bit according to a temperature of the semiconductor device,
• wherein the pass permission bit has a value that is reduced as the temperature becomes lower.

A semiconductor device comprising:

• a cell array including a plurality of memory cells arranged between a plurality of word lines and a plurality of bit lines;
• at least one page buffer coupled to the plurality of bit lines, respectively, and configured to, during a program operation, sense data of programmed memory cells among the plurality of memory cells to output a verification result including verification pass bits corresponding to the sensed data;
• a temperature sensor configured to sense a temperature of the semiconductor device;
• and
• a control circuit configured to:
• perform the program operation on the plurality of memory cells,
• determine a pass permission bit number corresponding to the sensed temperature,
• compare the verification pass bits with the pass permission bit number, and
• determine whether to further perform the program operation based on the comparison result,
• wherein the pass permission bit number is determined based on the sensed temperature such that the pass permission bit number increases as the sensed temperature increases.