Enhanced combination scan management for block families of a memory device

A method comprising:

• Initiating a scan operation on a plurality of block families of a memory device, wherein each of the plurality of block families is assigned to a respective voltage offset bin of a plurality of voltage offset bins;
• determining, based on the voltage offset bins of the plurality of block families and a time elapsed since execution of a previous scan operation of the plurality of block families, a scan priority of the plurality of block families;
• determining that a number of scan operations to be performed in a first scan interval is greater than a maximum number of scan operations to be performed in a scan interval;
• and
• scheduling, based on the scan priority, a scan operation of one or more block families of the plurality of block families during one or more subsequent scan intervals.

A non-transitory computer-readable storage medium comprising instructions that, when executed by a processing device, cause the processing device to:

• initiate a scan operation on a plurality of block families of a memory device, wherein each of the plurality of block families is assigned to a respective voltage offset bin of a plurality of voltage offset bins;
• determine that a number of scan operations to be performed in a first scan interval is greater than a maximum number of scan operations to be performed in a scan interval;
• determine, based on the voltage offset bins of the plurality of block families and a time elapsed since execution of a previous scan operation of the plurality of block families, a scan priority of the plurality of block families;
• and
• schedule, based on the scan priority, a scan operation of one or more block families of the plurality of block families during one or more subsequent scan intervals.