Apparatuses, systems, and methods for ODT pulse width duration determination
AssigneeMicron Technology, Inc.
InventorsYukimi Morimoto, Atsuko Momma
Life of this patent
Estimating the term…
Loading patent…
AssigneeMicron Technology, Inc.
InventorsYukimi Morimoto, Atsuko Momma
Estimating the term…
A memory device includes an ODT control circuit which provides an ODT pulse signal responsive to a command. The ODT control circuit compresses an ODT off latency added with a CRC bit based on a value of an ODT on latency. The compressed value of the ODT off latency added with a CRC bit is combined with the ODT on latency to generate a compressed ODT offset value. The duration of the ODT pulse signal is based on the compressed ODT offset value, a burst length, and an ODT pulse width parity. The combination of the compressed ODT offset and burst length is done along circuits of an even path or circuits of an odd path based on when the command was received. However, the compression and the generation of the ODT offset is shared between the even and odd paths.
An apparatus comprising:
An apparatus comprising:
A method comprising:
Dependencies are inferred from the claim text.