Inspection system and inspection method

An inspection system, comprising:

• a carrying device configured to carry an object to be inspected in an inspection region of the inspection system;
• at least one ray source configured to emit X-rays, wherein each ray source comprises a separate housing to define a vacuum space and comprises a plurality of target spots enclosed within the housing;
• and
• a detector assembly configured to receive X-rays emitted from the at least one ray source and passing through the inspection region,
• wherein the at least one ray source and the detector assembly are lifted or lowered along a central axis of the carrying device relative to the carrying device, and when viewed along the central axis, the at least one ray source is translatable between a plurality of scanning positions relative to the carrying device,
• wherein the inspection system is configured such that:
• when the at least one ray source is located at one of the plurality of scanning positions relative to the carrying device, the at least one ray source and the detector assembly are lifted or lowered along the central axis relative to the carrying device, and the at least one ray source emits X-rays, and when the at least one ray source and the detector assembly are lifted or lowered a predetermined distance relative to the carrying device, the at least one ray source translates to another one of the plurality of scanning positions relative to the carrying device,
• wherein the inspection system is further configured to reconstruct a three-dimensional scanning image of the object to be inspected based on detection data of the detector assembly,
• wherein a translation distance of the at least one ray source between two adjacent scanning positions relative to the carrying device is greater than a spacing between adjacent target spots of each ray source, and
• wherein the at least one ray source is further arranged to be movable between at least two target spot positions relative to the carrying device, and a rotation angle of each ray source between two adjacent target spot positions relative to the carrying device is less than an angle of two adjacent target spots of the ray source relative to the central axis, or a movement distance of each ray source between two adjacent target spot positions relative to the carrying device is less than a spacing between two adjacent target spots of the ray source.