Checking overlapping-free property for patches in mesh compression
AssigneeTencent America LLC
InventorsJun Tian, Shan Liu, Xiaozhong Xu, Xiang Zhang, Chao Huang
Life of this patent
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AssigneeTencent America LLC
InventorsJun Tian, Shan Liu, Xiaozhong Xu, Xiang Zhang, Chao Huang
Estimating the term…
Processing circuitry receive first UV coordinates associated with first vertices of a first patch and second UV coordinates associated with second vertices of a second patch. The first patch and the second patch are partitions from a three dimensional (3D) mesh, the 3D mesh represents a surface of an object with polygons and is partitioned into patches. The first patch includes the first vertices that are mapped to first two dimensional (2D) vertices of a first 2D patch in a 2D map according to the first UV coordinates, the second patch includes the second vertices that are mapped to second 2D vertices of a second 2D patch in the 2D map according to the second UV coordinates. The processing circuitry can apply various overlapping checking techniques on the first 2D patch and the second 2D patch.
A method for mesh processing, comprising:
An apparatus for mesh processing, comprising processing circuitry configured to:
A non-transitory computer-readable storage medium storing instructions which when executed by at least one processor cause the at least one processor to perform:
Dependencies are inferred from the claim text.