Inspection apparatus, method of manufacturing template, and method of inspecting template
AssigneeKioxia Corporation
InventorsKeisuke Chiba, Ryoji Yoshikawa
Life of this patent
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AssigneeKioxia Corporation
InventorsKeisuke Chiba, Ryoji Yoshikawa
Estimating the term…
An inspection apparatus according to an embodiment is an inspection apparatus that inspects a defect for a sample having a region including a plurality of patterns with different heights from a reference plane in a first direction intersecting the reference plane, including a focus decision unit that decides a plurality of target values regarding a relative position between the reference plane and the lens on a basis of height information regarding the height, an image acquisition unit that adjusts the relative position between the reference plane and the lens on a basis of the plurality of target values and causes the imaging unit to capture a plurality of images including a whole of the region from the first direction at the respective relative positions, an image synthesis unit that extracts a first part including a first pattern from a first image among the plurality of images, extracts a second part including a second pattern from a second image among the plurality of images, and generates a synthetic image including the first part and the second part, and a defect determination unit that determines presence or absence of the defect for the sample from the synthetic image.
An inspection apparatus that inspects for a defect in a sample having a region including a plurality of patterns with different heights from a reference plane in a first direction intersecting the reference plane, the inspection apparatus comprising:
A method of manufacturing a template having a region including a plurality of patterns with different heights from a reference plane in a first direction intersecting the reference plane, the method comprising:
A method of inspecting a template having a region including a plurality of patterns with different heights from a reference plane in a first direction intersecting the reference plane, the method comprising:
Dependencies are inferred from the claim text.