Methods and system with dynamic ECC voltage and frequency
OwnerJonathan Scott Parry, Nadav Grosz +2inventors
InventorsJonathan Scott Parry, Nadav Grosz, David Aaron Palmer, Christian M. Gyllenskog
Life of this patent
Estimating the term…
Abstract
Apparatus and methods are disclosed, including using a memory controller to monitor at least one parameter related to power level of a host processor of a host device, and dynamically adjusting at least one of a clock frequency and a voltage level of an error-correcting code (ECC) subsystem of the memory controller based on the at least one parameter to control power usage of the host device.
Claims19
A storage system, comprising:
- a memory array;
- and
- a memory controller that comprises an error-correcting code (ECC) subsystem and that is configured to:
- communicate with a host processor to implement interactions between the host processor and the memory array;
- monitor at least temperature of at least a portion of the storage system;
- and
- limit power consumption of the ECC subsystem of the memory controller based at least in part on the monitored temperature to control power usage of the host processor.
A non-transitory, computer-readable medium comprising instructions thereon that, when executed by a memory controller, cause the memory controller to perform operations comprising:
- monitoring at least temperature related to processing speed of a host processor of a host device configured to communicate with the memory controller;
- and
- limiting power consumption of an error-correcting code (ECC) subsystem of the memory controller based on the monitored temperature to control power usage of the host device.
A storage system, comprising:
- a memory array;
- monitoring circuitry configured to monitor at least a temperature of the storage system;
- and
- a memory controller that comprises an error-correcting code (ECC) subsystem and that is configured to:
- monitor the temperature of the storage system via the monitoring circuitry;
- and
- limit power consumption of the ECC subsystem of the memory controller based at least in part on the monitored temperature of the storage system.
Dependencies are inferred from the claim text.