Test and measurement instrument, test and measurement setup and method of measuring a device under test

A method of measuring a device under test by a test and measurement instrument having an input and a processing circuit, wherein the method comprises:

• receiving, by the input, at least a waveform of a test signal, wherein the waveform comprises a plurality of samples;
• analyzing, by the processing circuit, the waveform received by the input;
• selecting, by the processing circuit, at least a subset of samples out of the plurality of samples, wherein the selected subset of samples matches predefined criteria concerning at least one of bandwidth, amplitude distribution, and amplitude percentiles;
• and
• generating, by the processing circuit, a modified waveform based on the selected subset of samples, wherein the modified waveform comprises a smaller amount of samples than the waveform of the test signal;
• generating a signal based on the modified waveform, the generated signal being inputted to the device under test for processing the generated signal and generating a measurement signal based on the generated signal.

A test and measurement instrument for measuring a device under test, the test and measurement instrument comprising:

• an input configured to receive at least a waveform of a test signal, wherein the waveform comprises a plurality of samples;
• a processing circuit connected with the input, wherein the processing circuit is configured to analyze the waveform received by the input and to select at least a subset of samples out of the plurality of samples of the waveform received, wherein the selected subset of samples matches predefined criteria concerning at least one of bandwidth, amplitude distribution, and amplitude percentiles;
• a signal receiver circuit configured to receive a measurement signal from the device under test and to digitize the received measurement signal, thereby obtaining a digitized measurement signal;
• a signal analyzer circuit connected with the signal receiver circuit and configured to receive the digitized measurement signal from the signal receiver circuit,
• wherein the signal receiver circuit is configured to forward only a part of the digitized measurement signal to the signal analyzer circuit, and
• wherein the forwarded part of the digitized measurement signal corresponds to the selected subset of samples such that the test and measurement instrument is configured to measure only the selected subset of samples.