Semiconductor integrated circuit device

A semiconductor integrated circuit device, comprising:

• an output transistor that is connected between a voltage input terminal to which a DC voltage is input and a voltage output terminal;
• a control circuit that controls an on state or an off state of the output transistor;
• an overcurrent detection circuit that is configured to detect a current that is a predetermined value or more flowing in the output transistor;
• a retry circuit that generates and outputs a signal to intermittently switch the output transistor to the off state according to the overcurrent detection circuit detecting an overcurrent state of an output current;
• and
• an external terminal that is configured to output an error flag signal showing an abnormality of an internal circuit,
• wherein the control circuit is configured to repeat control to temporarily turn off the output transistor based on a signal output from the retry circuit,
• wherein after the overcurrent detection circuit detects the overcurrent state of the output current, the retry circuit is configured so that the error flag signal continuously shows an abnormality while the control circuit repeats control to temporarily turn off the output transistor,
• wherein the retry circuit includes:
• a timer circuit that includes a first constant current source that charges a capacitor and a second constant current source that discharges the capacitor, wherein the timer circuit counts a predetermined amount of time,
• a first voltage comparison circuit that compares a voltage of a charge/discharge node of the timer circuit with a predetermined first low threshold value voltage or a predetermined first high threshold value voltage, and
• a second voltage comparison circuit that compares a voltage of a charge/discharge node of the timer circuit with a predetermined second low threshold value voltage or a predetermined second high threshold value voltage,
• wherein the first voltage comparison circuit and the second voltage comparison circuit use a higher threshold value voltage in a comparison when the voltage that is a target to be compared is rising, and use a lower threshold value voltage in a comparison when the voltage that is the target to be compared is decreasing,
• wherein the retry circuit changes the error flag signal to a state showing an abnormality when it is detected that the voltage of the charge/discharge node is higher than the first high threshold value voltage or the second high threshold value voltage based on a signal output from the first voltage comparison circuit or the second voltage comparison circuit, and
• wherein the retry circuit returns the error flag signal to a state showing normal when the first voltage comparison circuit detects that the voltage of the charge/discharge node is equal to or lower than the first low threshold value voltage and the second voltage comparison circuit detects that the voltage of the charge/discharge node is equal to or lower than the second low threshold value voltage.