Mixed-gas species plasma source system
AssigneeFEI Company
InventorsDavid Levi, Kevin Kagarice, Daniel Totonjian
Life of this patent
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AssigneeFEI Company
InventorsDavid Levi, Kevin Kagarice, Daniel Totonjian
Estimating the term…
An ion beam system including a plasma source tube defining a plasma source chamber, a first gas reservoir housing a first gas, a second gas reservoir housing a second gas, a first controller fluidly coupled to the first gas reservoir and configured to control a first flow rate of the first gas, and a second controller fluidly coupled to the second gas reservoir and configured to control a second flow rate of the second gas. The system also includes a first capillary constriction including a first end fluidly coupled to the first controller and a second end fluidly coupled to the plasma source chamber, and a second capillary constriction including a third end fluidly coupled to the second controller and a fourth end fluidly coupled to the plasma source chamber, where the first capillary constriction and the second capillary constriction are distinct.
An ion beam system, comprising:
An ion beam system, comprising:
An ion beam system, comprising:
A non-transitory computing-device readable storage medium on which computing-device readable instructions of a program are stored, the instructions, when executed by one or more computing devices, causing the one or more computing devices to perform operations comprising:
Dependencies are inferred from the claim text.