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US 12,608,637 B2Granted
Active piezo stabilization of an ion trap
AssigneeIonQ, Inc.
InventorsKai Makoto Hudek, Jason Madjdi Amini
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Abstract
Aspects of the present disclosure relate generally to systems and methods for use in the implementation and/or operation of quantum information processing (QIP) systems, and more particularly, to provide stabilization of a position of an ion trap via displacement of one or more piezoelectric elements.
Claims22
A quantum information processing (QIP) system comprising:
- an ion trap system comprising:
- an ion trap substrate configured to trap one or more ions;
- a piezoelectric element coupled to the ion trap substrate;
- and
- a carrier configured to transmit signals between the ion trap substrate and components of the QIP system.
2 more elements
A method for active piezoelectric stabilization of an ion trap, the method comprising:
- determining, by a controller including a processor and a memory, that ions trapped in an ion trap substrate are likely misaligned relative to a Raman beam;
- determining, by the controller, an amount of displacement between the ion trap substrate and the Raman beam;
- determining, by the controller, an amount of voltage to apply to a piezoelectric element coupled to the ion trap substrate to compensate for the determined displacement;
- and
- commanding, by the controller, a voltage source to apply the determined voltage to the piezoelectric element to adjust a position of the ion trap substrate to align the ions trapped in the ion trap substrate with the Raman beam.
2 more elements
A method for active piezoelectric stabilization of an imaging system including at least one of a lens and a detector, the method comprising:
- determining, by a controller including a processor and a memory, that ions trapped in an ion trap substrate are likely misaligned relative to at least of one of the lens and the detector;
- determining, by the controller, an amount of displacement between the ion trap substrate and at least one of the lens and the detector;
- determining, by the controller, an amount of voltage to apply to a piezoelectric element coupled to the ion trap substrate to compensate for the determined displacement;
- and
- commanding, by the controller, a voltage source to apply the determined voltage to the piezoelectric element to adjust a position of the ion trap substrate to align the ions trapped in the ion trap substrate with at least one of the lens and the detector.
2 more elements
Dependencies are inferred from the claim text.