Optical structure and method for manufacturing optical structure
AssigneesBeijing BOE Technology Development Co., Ltd., Boe Technology Group Co., Ltd.
InventorJian Zhou
Life of this patent
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Abstract
The disclosure relates to an optical structure and a method for manufacturing an optical structure. The optical structure includes: a substrate layer; a first isolation layer on the substrate layer and having a first opening on a side away from the substrate layer; a second isolation layer on the first isolation layer and having a second opening on a side away from the substrate layer, wherein a projection of the first opening on the substrate layer overlaps at least partially with a projection of the second opening on the substrate layer, and wherein a ratio of a refractive index of the first isolation layer to a refractive index of the second isolation layer is in a range of 0.95 and 1.05; and a first conductive portion in the second isolation layer and filling at least the second opening.
Claims18
An optical structure, comprising:
- a substrate layer;
- a first isolation layer on the substrate layer and having a first opening on a side away from the substrate layer;
- a second isolation layer on the first isolation layer and having a second opening on a side away from the substrate layer, wherein a projection of the first opening on the substrate layer overlaps at least partially with a projection of the second opening on the substrate layer, and wherein a ratio of a refractive index of the first isolation layer to a refractive index of the second isolation layer is in a range of 0.95 and 1.05;
- a first conductive portion in the second isolation layer and filling at least the second opening;
- a third isolation layer on the second isolation layer and covers a surface of the first conductive portion away from the substrate layer, wherein the third isolation layer has a third opening;
- a fourth isolation layer on the third isolation layer and having a fourth opening, wherein a projection of the third opening on the substrate layer overlaps at least partially with a projection of the fourth opening on the substrate layer;
- and
- a second conductive portion in the fourth isolation layer and filling at least the fourth opening,
- wherein a first extension direction of the first conductive portion in a plane parallel to the substrate layer differs from a second extension direction of the second conductive portion in the plane parallel to the substrate layer, and wherein a projection of the first conductive portion on the substrate layer overlaps with a projection of the second conductive portion on the substrate layer.
A method for fabricating an optical structure, comprising:
- forming a first isolation layer on a substrate layer, wherein the first isolation layer has a first opening on a side away from the substrate layer;
- forming a second isolation layer on the first isolation layer, wherein the second isolation layer has a second opening on a side away from the substrate layer, wherein a projection of the first opening on the substrate layer overlaps at least partially with a projection of the second opening on the substrate layer, and wherein a ratio of the refractive index of the first isolation layer to the refractive index of the second isolation layer is in a range of 0.95 to 1.05;
- forming, in the second isolation layer, a first conductive layer filling the second opening;
- forming a third isolation layer on the second isolation layer, wherein the third isolation layer covers a surface of the first conductive portion away from the substrate layer and has a third opening, and wherein a projection of the third opening on the substrate layer overlaps at least partially with a projection of the fourth opening on the substrate layer;
- forming a fourth isolation layer on the third isolation layer, the fourth isolation layer having a fourth opening;
- and
- forming a second conductive portion in the fourth isolation layer, wherein the fourth isolation layer is in the fourth isolation layer and fills at least the fourth opening,
- wherein a first extension direction of the first conductive portion in a plane parallel to the substrate layer differs from a second extension direction of the second conductive portion in the plane parallel to the substrate layer, and wherein a projection of the first conductive portion on the substrate layer overlaps with a projection of the second conductive portion on the substrate layer.
Dependencies are inferred from the claim text.