System and method for in-situ mapping on electrode potential and thermal distribution
AssigneeGM Global Technology Operations LLC
InventorsJing Gao, Brian J. Koch, Taylor R. Garrick, Wei Zeng
Life of this patent
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Abstract
A system for in-situ mapping of electrode potential and thermal distribution is provided. The system includes a test device. The test device includes an anode, a cathode, a reference electrode, a separator disposed between the anode and the cathode, and a voltage potential sensor configured for monitoring a voltage potential at a first position upon one of the anode or the cathode as compared to a voltage potential of the reference electrode. The system further includes an infrared sensor device configured for collecting data describing temperature variation across a surface of one of the anode or the cathode.
Claims18
A system for in-situ mapping of electrode potential and thermal distribution, the system including:
- a test device, including:
- an anode;
- a cathode;
- a reference electrode;
- a separator disposed between the anode and the cathode;
- and
- a voltage potential sensor configured for monitoring a first voltage potential at a first position upon one of the anode or the cathode as compared to a second voltage potential of the reference electrode;
- an infrared sensor device configured for collecting data describing temperature variation across a surface of one of the anode or the cathode;
- and
- a computerized device including programming to:
- monitor data generated by the voltage potential sensor;
- monitor data generated by the infrared sensor device;
- control operation of a test cycle including controlling operation of the anode and the cathode through the test cycle;
- and
- analyze the monitored data generated by voltage potential sensor and the infrared sensor device during the test cycle to provide correlated voltage potential distribution data and temperature distribution data across the surface of the one of the anode and the cathode.
A system for in-situ mapping of electrode potential and thermal distribution, the system including:
- a test device, including:
- an anode;
- a cathode;
- a reference electrode;
- a separator disposed between the anode and the cathode;
- a plurality of voltage potential sensors configured for monitoring a first voltage potential distribution within one of the anode or the cathode as compared to a second voltage potential of the reference electrode;
- a plurality of temperature sensors;
- a pressure sensor providing data regarding a pressure within the test device;
- and
- an infrared transparent wall;
- and
- an infrared sensor device configured for collecting data describing temperature variation across a surface of one of the anode or the cathode through the infrared transparent wall, wherein the plurality of temperature sensors are configured for calibrating the infrared sensor device;
- and
- a computerized device including programming to:
- monitor data generated by the plurality of voltage potential sensor;
- monitor data generated by the plurality of temperature sensors;
- monitor data generated by the pressure sensor;
- monitor data generated by the infrared sensor device;
- control operation of a test cycle including controlling operation of the anode and the cathode through the test cycle;
- and
- analyze the monitored data generated by the plurality of voltage potential sensors, the plurality of temperature sensors, the pressure sensor, and the infrared sensor device during the test cycle to provide correlated voltage potential distribution data and temperature distribution data across the surface of the one of the anode and the cathode.
A method for in-situ mapping of electrode potential and thermal distribution, the method including:
- operating a test device including an anode, a cathode, a separator, a reference electrode, and a plurality of voltage potential sensors disposed to provide data regarding voltage potential distribution within the anode or the cathode;
- operating an infrared sensor device to provide data regarding a temperature distribution across a surface of one of the anode or the cathode;
- operating a test cycle including controlling operation of the anode and the cathode to generate the voltage potential distribution and the temperature distribution within the test device;
- analyzing the data regarding the voltage potential distribution and the data regarding the temperature distribution collected during the test cycle;
- and
- configuring an electrode for manufacture based upon the analyzing.
Dependencies are inferred from the claim text.