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AssigneeHitachi GE Vernova Nuclear Energy, Ltd.
InventorsKaname Saga, So Kitazawa, Akihiko Hirano, Yoshizumi Fukuhara, Junta Yamada
Estimating the term…
An ultrasonic inspection apparatus includes a control device 12 that outputs a pulse signal for making an ultrasonic probe 11A transmit an ultrasonic wave to the ultrasonic probe 11A and that is supplied with a waveform signal obtained by converting the received ultrasonic wave from an ultrasonic probe 11B, and that computes a thickness reduction depth of a pipe 1 between the ultrasonic probe 11A and the ultrasonic probe 11B. The control device 12 computes the thickness reduction depth of the pipe 1 by selectively using a reception time of the ultrasonic wave transmitted from the ultrasonic probe 11A, reflected once by an inner surface 3 of the pipe 1, and received by the ultrasonic probe 11B, and a reception time of the ultrasonic wave transmitted from the ultrasonic probe 11A, reflected twice by the inner surface 3 of the pipe 1, and received by the ultrasonic probe 11B.
An ultrasonic inspection apparatus comprising:
An ultrasonic wave inspection method of transmitting an ultrasonic wave to an inside of an inspection object by a first ultrasonic probe disposed on an outer surface of the inspection object, and receiving the ultrasonic wave reflected by an inner surface of the inspection object by a second ultrasonic probe disposed on the outer surface of the inspection object so as to be separated from the first ultrasonic probe, the ultrasonic wave inspection method comprising:
Dependencies are inferred from the claim text.