A system for synchronously detecting thickness and double-side surface profiles, comprising:
- a light source system, a deflection reflection system, a camera acquisition system, and a processing system, wherein
- the light source system is configured to provide an optical signal, wherein the light source system comprises a light source generator adopting a digital light processing projector, and the digital light processing projector projects structured light with a specific sign meeting three-dimensional point cloud reconstruction;
- the deflection reflection system is configured to split the optical signal into two beams of sub-optical signals which are obliquely projected on an upper surface and a lower surface of an object to be measured at the same time, and simultaneously collect the sub-optical signals which are respectively reflected on the upper surface and the lower surface of the object to be measured into one beam of composite optical signal and output the composite optical signal to the camera acquisition system;
- the camera acquisition system is configured to acquire the composite optical signal outputted by the deflection reflection system and generate image data;
- the processing system is configured to analyze the image data to obtain thickness and surface profile data of the object to be measured;
- the deflection reflection system comprises:
- a first plane mirror, a second plane mirror, a first beam splitter prism, a second beam splitter prism, a first reflecting mirror, a second reflecting mirror, a third reflecting mirror, and a fourth reflecting mirror, wherein
- the optical signal emitted by the light source system is reflected to the first beam splitter prism through the first plane mirror, and the first beam splitter prism splits the optical signal into two beams of sub-optical signals, wherein one beam of sub-optical signal is reflected on the upper surface of the object to be measured through the first reflecting mirror, and the other beam of sub-optical signal is reflected on the lower surface of the object to be measured through the second reflecting mirror;
- the third reflecting mirror receives the sub-optical signal reflected on the upper surface of the object to be measured and reflects the sub-optical signal to the second beam splitter prism, the fourth reflecting mirror receives the sub-optical signal reflected on the lower surface of the object to be measured and reflects the sub-optical signal to the second beam splitter prism, the second beam splitter prism collects the two beams of received sub-optical signals into one beam of composite optical signal and projects the composite optical signal to the second plane mirror, and the second plane mirror reflects the composite optical signal to the camera acquisition system;
- and
- the processing system
- is configured to:
- construct surface profile data of the upper surface and surface profile data of the lower surface of the object to be measured respectively based on the image data acquired by the camera acquisition system;
- unify and splice the surface profile data of the upper surface and the surface profile data of the lower surface of the object to be measured based on a transformation matrix between the upper surface and the lower surface to obtain complete surface profile data of the object to be measured;
- and
- obtain a thickness of the object to be measured according to the complete surface profile data.