RF-based material identification systems and methods
AssigneeQuantum IP, LLC
InventorsRobert J. Short, Jr., Lee Duke
Life of this patent
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AssigneeQuantum IP, LLC
InventorsRobert J. Short, Jr., Lee Duke
Estimating the term…
A system for material detection and identification includes an interface configured to access a material database associating each of a plurality of materials with one or more corresponding resonance frequencies; an RF transmitter configured to, for each material of at least a subset of the plurality of materials in the material database, transmit into an environment an RF signal at a first resonance frequency for the material; an RF receiver configured to receive a response signal from the environment for each RF signal; and a processor configured to analyze each response signal for resonance characteristics that indicate a presence of the material and identifying the material to a user if the presence of the material is indicated by the resonance characteristics.
A method for identifying detected materials, the method comprising:
A system for identifying detected materials, the system comprising:
Dependencies are inferred from the claim text.