System and method for predicting the presence of rare earth elements
AssigneeMicrobeam Technologies, Inc.
InventorsMatthew Fuka, Eric Kolb, Alexander Benson, Steven Benson
Life of this patent
Estimating the term…
Loading patent…
AssigneeMicrobeam Technologies, Inc.
InventorsMatthew Fuka, Eric Kolb, Alexander Benson, Steven Benson
Estimating the term…
A system for predicting rare earth elements (REEs) in a feedstock sample includes a measurement instrument that records a measurement for a sample, a processor communicatively coupled to the measuring instrument, and a memory communicatively coupled to the processor and containing machine readable instructions that, when executed by the processor, cause the processor to correlate the measurement series using a model; and predict a presence of one or more rare earth element based at least in part on the correlation. A method for predicting rare earth elements includes measuring feedstock samples via XRF or PGNAA, to generate a measurements of elements of interest with a lower atomic weight than REEs; correlating the measurements with a model; and predicting a presence of one or more rare earth elements based at least in part on the correlation.
A system for predicting the presence of rare earth elements (REEs) in a feedstock, comprising:
Dependencies are inferred from the claim text.