Crystal structure analysis method, crystal structure analysis device, and crystal structure analysis program
AssigneeRigaku Corporation
InventorsAkihito Yamano, Takashi Matsumoto, Hiroyuki Kanda
Life of this patent
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AssigneeRigaku Corporation
InventorsAkihito Yamano, Takashi Matsumoto, Hiroyuki Kanda
Estimating the term…
A crystal structure analysis in which: each of a plurality of samples are irradiated while the angle of incidence is continuously changed by rotating the crystal, whereby diffraction spot intensity and reliability for a plurality of crystal lattice planes are determined and a data set (Data-1, Data-2, Data-3, . . . , Data-n) is acquired; whether or not to perform merging, which is a process of combining multiple sets of data into one, is determined for each individual set of data on the basis of a merging criterion (e.g., Rint, completeness); merging is performed on data for which merging is to be performed; and a crystal structure is determined according to merged data. A crystal structure analysis result is obtained in a crystal structure analysis method, a crystal structure analysis device, and a crystal structure analysis program in which a crystal structure is determined by data-processing and analyzing a plurality of diffraction profiles.
A crystal structure analysis method in which a crystal structure is determined on the basis of a plurality of samples, the crystal structure analysis method comprising:
A crystal structure analysis device that identifies a crystal structure on the basis of a plurality of samples, said device comprising:
A program that instructs a crystal structure analysis procedure to be performed, in which a crystal structure is determined on the basis of a plurality of samples, said program causing a computer to execute the following procedures:
Dependencies are inferred from the claim text.