Chip manufacturing method using a laser beam with first and second focused points

A chip manufacturing method for dividing a workpiece along a projected dicing line established thereon into a plurality of chips, comprising:

• a modified layer forming step of applying a branched laser beam that is transmittable through the workpiece and focused into a first focused point from a first laser beam of the branched laser beam and a second focused point from a second laser beam of the branched laser beam, to the workpiece simultaneously along the projected dicing line while positioning the first focused point and the second focused point within the workpiece, thereby forming a plurality of modified regions in the workpiece, wherein the modified layer forming step includes applying the first laser beam to the workpiece while forming one of the modified regions around a region where the first focused point is positioned, and simultaneously applying the second laser beam to the workpiece such that the second focused point is positioned in superposed relation to an immediately previously formed modified region formed by the first laser beam in the workpiece;
• a moving step of moving the workpiece and the branched laser beam relative to each other along the projected dicing line thus defining how at least one modified region is formed by a first pulse and how a second pulse involves forming at least one modified region superposed on the immediately previously formed modified region;
• and
• a dividing step of imposing external forces on the workpiece to divide the workpiece into individual chips along the projected dicing line from the modified regions that function as division initiating points.