Method for measuring DAC nonlinearity error based on pseudo-random sequence

A method for measuring a Digital-to-Analog Converter (DAC) nonlinearity error based on a pseudo-random sequence, comprising:

• numbering pseudo-random number values in a pseudo-random sequence according to an order in which the pseudo-random number values are generated so as to generate a serial number sequence;
• arranging the pseudo-random number values in the serial number sequence in a descending or ascending order to determine an order random array;
• sending the pseudo-random number values, as DAC code values, in the order random array to the DAC to be measured sequentially;
• determining a first differential voltage array, through having the DAC to be measured output a voltage corresponding to the DAC code values, according to the DAC code values;
• determining a second differential voltage array according to the voltage corresponding to the DAC code values and outputted by the DAC to be measured and the DAC code values;
• determining a differential nonlinearity error test result of the DAC to be measured and an integral nonlinearity error test result of the DAC to be measured according to the first differential voltage array and the second differential voltage array;
• and
• determining a nonlinearity error measurement result of the DAC to be measured according to the differential nonlinearity error test result of the DAC to be measured and the integral nonlinearity error test result of the DAC to be measured.