Charged particle beam apparatus and processor system
AssigneeHitachi High-Tech Corporation
InventorsAkio Yamamoto, Wen Li, Shunsuke Mizutani, Naoya Ishigaki
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AssigneeHitachi High-Tech Corporation
InventorsAkio Yamamoto, Wen Li, Shunsuke Mizutani, Naoya Ishigaki
Estimating the term…
There is provided a technique capable of reducing deterioration of a back scattered electron (BSE) detector caused by a dark pulse. Charged particle beam apparatus includes: a plurality of BSE detectors configured to detect a BSE from a sample; and a controller. The controller acquires, within a period, a first peak time of a first peak included in an output signal from a first BSE detector among the plurality of BSE detectors, and a second peak time of a second peak included in an output signal from a second BSE detector other than the first BSE detector among the plurality of BSE detectors, determines, when the second peak is present where a time difference between the first peak time and the second peak time is within a threshold value, that the first peak is caused by the BSE, and determines, when the second peak is not present where the time difference is within the threshold value, that the first peak is caused by the dark pulse.
Charged particle beam apparatus comprising:
Charged particle beam apparatus comprising:
A processor system comprising:
Dependencies are inferred from the claim text.