Initial setting device of semiconductor memory to determine valid setting

An initial setting device of a semiconductor memory device, comprising:

• a voltage detection unit, detecting a voltage of a power supply;
• a first non-volatile memory device, comprising a non-volatile memory unit storing first setting information for setting an operation condition of the semiconductor memory;
• a control unit, reading the first setting information of the first non-volatile memory device based on a voltage level of the detected voltage of the power supply;
• a determination unit, determining whether the first setting information is valid;
• wherein the determination unit is configured to determine whether the first setting information is valid by comparing the first setting information read by a first time reading and a second time reading from the non-volatile memory unit;
• wherein the determination unit determines that the first setting information is invalid when the first setting information read by the first time reading and the second time reading are different;
• wherein when the first setting information is determined to be invalid, following steps are repeatedly performed until the first setting information is determined to be valid:
• a first step, in which the control unit is configured to change a reading condition of the first setting information and read the first setting information for the first time reading and the second time reading;
• a second step, in which the determination unit is configured to determine whether the first setting information is valid by comparing the first setting information read by the first time reading and the second time reading from the non-volatile memory unit in the first step.