Method and apparatus for identifying defect grade of bad picture, and storage medium

An apparatus for identifying a defect grade of a bad picture, comprising:

• at least one processor, and
• a memory connected with the at least one processor;
• wherein the memory stores instructions that are executable by the at least one processor and the at least one processor is configured to execute the instructions stored in the memory to perform:
• determining a defect size of a defect from the bad picture;
• according to a product model corresponding to the bad picture, determining a design size of a pattern corresponding to a component that is adjacent to a position of the defect;
• and
• determining the defect grade of the defect according to a defect type of the defect and a magnitude relationship between the defect size and the design size, wherein the defect grade is a degree to which the defect affects product yield;
• wherein the at least one processor is further configured to execute the instructions stored in the memory to perform:
• determining the defect type of the defect by a neural network model in an automatic defect classification system, and determining a determination condition of the defect grade used for the defect;
• wherein in a cast that the bad picture is a bad picture in a display panel, the defect type comprises a particle defect and a passivation open defect;
• obtaining a determination result by comparing a ratio of the defect size to the design size with a set magnification according to the determination condition;
• and
• determining the defect grade according to the determination result;
• wherein the at least one processor is further configured to execute the instructions stored in the memory to perform:
• in a case that the defect type is the particle defect, determining to use a determination condition of the particle defect for the bad picture, wherein a value of the set magnification ranges from 1.3 to 1.7;
• in a case that the defect type is the passivation open defect, determining to use a determination condition of the passivation open defect for the bad picture, wherein a value of the set magnification ranges from 0.8 to 1.2.

A non-transitory computer-readable storage medium, comprising a memory,

• the memory being configured for storing instructions that, when executed by a processor, cause an apparatus comprising the non-transitory computer-readable storage medium to perform:
• determining a defect size of a defect from the bad picture;
• according to a product model corresponding to the bad picture, determining a design size of a pattern corresponding to a component that is adjacent to a position of the defect;
• and
• determining the defect grade of the defect according to a defect type of the defect and a magnitude relationship between the defect size and the design size, wherein the defect grade is a degree to which the defect affects product yield;
• wherein the instructions, when executed by the processor, further cause the apparatus comprising the non-transitory computer-readable storage medium to perform:
• determining the defect type of the defect by a neural network model in an automatic defect classification system, and determining a determination condition of the defect grade used for the defect;
• wherein in a case that the bad picture is a bad picture in a display panel, the defect type comprises a particle defect and a passivation open defect;
• obtaining a determination result by comparing a ratio of the defect size to the design size with a set magnification according to the determination condition;
• and
• determining the defect grade according to the determination result;
• wherein the instructions, when executed by the processor, further cause the apparatus comprising the non-transitory computer-readable storage medium to perform:
• in a case that the defect type is the particle defect, determining to use a determination condition of the particle defect for the bad picture, wherein a value of the set magnification ranges from 1.3 to 1.7;
• in a case that the defect type is the passivation open defect, determining to use a determination condition of the passivation open defect for the bad picture, wherein a value of the set magnification ranges from 0.8 to 1.2.