Circuit analysis method, circuit analysis device, and circuit analysis system
AssigneeSamsung Electronics Co., Ltd.
InventorsKwangsun Kim, Hyungjung Seo
Life of this patent
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AssigneeSamsung Electronics Co., Ltd.
InventorsKwangsun Kim, Hyungjung Seo
Estimating the term…
Provided are a circuit analysis method, a circuit analysis device, and a circuit analysis system. An embodiment provides a circuit analysis method, including: building a circuit graph based on a netlist of a circuit; defining a node in the circuit graph; extracting an X (unknown) event for each node based on a waveform built as a result of simulation for the node; building an X event node from the X event that was extracted; building an X event graph by linking the X event node to at least one other X event node; traversing the X event graph and identifying a source X event and an involvement X event; and finding an X propagation path for the X event node, the X propagation path comprising the source X event and the involvement X event.
A circuit analysis method, comprising:
A circuit analysis device, comprising:
A circuit analysis system, comprising:
Dependencies are inferred from the claim text.