Failure diagnosis method, method of manufacturing disk device, and recording medium
AssigneesKabushiki Kaisha Toshiba, Toshiba Electronic Devices & Storage Corporation
InventorYoshinari Higashino
Life of this patent
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Abstract
According to an embodiment, there is provided a failure diagnosis method. The failure diagnosis method includes installing a disk device in a manufacturing rack. The failure diagnosis method acquiring, by the disk device, data on a state of a predetermined constituent unit in the manufacturing rack with the disk device being installed in the manufacturing rack. The failure diagnosis method includes determining, by the disk device, whether or not the state of the predetermined constituent unit falls within an allowable range by using the data acquired.
Claims19
A method of manufacturing a disk device comprising:
- installing a disk device in a manufacturing rack and diagnosing, by the disk device, a failure of the manufacturing rack by a failure diagnosis method, the failure diagnosis method comprising:
- acquiring, by the disk device, data on a state of a predetermined constituent unit in the manufacturing rack with the disk device being installed in the manufacturing rack;
- and
- determining, by the disk device, whether or not the state of the predetermined constituent unit falls within an allowable range by using the data acquired;
- and
- manufacturing the disk device by using the manufacturing rack when the manufacturing rack has not failed.
A method of manufacturing a disk device comprising:
- installing a disk device in a manufacturing rack and diagnosing, by the disk device, a failure of the manufacturing rack, using a non-transitory computer readable recording medium having a failure diagnosis program, the failure diagnosis program causing a computer to perform:
- acquiring, by the disk device, data on a state of a predetermined constituent unit in the manufacturing rack with the disk device being installed in the manufacturing rack;
- and
- determining, by the disk device, whether or not the state of the predetermined constituent unit falls within an allowable range by using the data acquired;
- and
- manufacturing the disk device by using the manufacturing rack when the manufacturing rack has not failed.
Dependencies are inferred from the claim text.