Spring probe assembly for a Kelvin testing system
AssigneeJohnstech International Corporation
InventorValts Treibergs
Life of this patent
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Abstract
A spring probe assembly for a Kelvin testing system for testing integrated circuit devices is disclosed. The assembly includes a force spring probe and a sense spring probe. Each of the force spring probe and the sense spring probe includes a head; a body containing at least one resilient element; and a bottom. The body has a cylindrical shape, and the head and the body have a same diameter in an end view. The head includes a base and a top integrated with the base. The base has a cylindrical shape. The head includes a shoulder between the base and the top. The top includes an apex. The force spring probe and the sense spring probe are disposed so that the apexes of the force spring probe and the sense spring probe are adjacent to each other.
Claims20
A spring probe assembly for a Kelvin testing system for testing integrated circuit devices, comprising:
- a force spring probe and a sense spring probe,
- wherein the force spring probe and the sense spring probe are generally identical to each other in shape and size,
- wherein each of the force spring probe and the sense spring probe includes a head;
- a body containing at least one resilient element;
- and a bottom,
- wherein the body has a cylindrical shape, the head and the body have a same diameter in an end view,
- wherein the head includes a base and a top integrated with the base, the base has a cylindrical shape, the top includes a half-cylinder and an apex, and a straight edge and a curved edge on a flat surface of the top extending from the apex,
- wherein the top has a flat side surface perpendicular to a flat upper surface of the base, the top has a right-angle trapezoid shape in a side view as viewed in a direction facing the flat side surface of the top,
- wherein the head includes a shoulder between the base and the top,
- wherein the force spring probe and the sense spring probe are disposed so that the apexes of the force spring probe and the sense spring probe are adjacent to each other.
A Kelvin testing system for testing integrated circuit devices, comprising:
- a device under test;
- a load board;
- and
- a spring probe assembly including:
- a force spring probe and a sense spring probe,
- wherein the force spring probe and the sense spring probe are generally identical to each other in shape and size,
- wherein each of the force spring probe and the sense spring probe includes a head;
- a body containing at least one resilient element;
- and a bottom,
- wherein the body has a cylindrical shape, the head and the body have a same diameter in an end view,
- wherein the head includes a base and a top integrated with the base, the base has a cylindrical shape, the top includes a half-cylinder and an apex, and a straight edge and a curved edge on a flat surface of the top extending from the apex,
- wherein the top has a flat side surface perpendicular to a flat upper surface of the base, the top has a right-angle trapezoid shape in a side view as viewed in a direction facing the flat side surface of the top,
- wherein the head includes a shoulder between the base and the top,
- wherein the force spring probe and the sense spring probe are disposed so that the apexes of the force spring probe and the sense spring probe are adjacent to each other.
A spring probe assembly for a Kelvin testing system for testing integrated circuit devices, comprising:
- a force spring probe and a sense spring probe,
- wherein the force spring probe and the sense spring probe are generally identical to each other in shape and size,
- wherein each of the force spring probe and the sense spring probe includes a head;
- a body;
- and a bottom,
- wherein the body has a cylindrical shape,
- wherein the head includes a base and a top integrated with the base, the base has a cylindrical shape, the top is a half-cylinder with a flat front portion and an angular tip portion, the angular tip portion has a chisel point apex;
- a curved edge on a flat surface of the top extending from the apex;
- and a straight edge on the flat surface of the top extending from the apex,
- wherein the flat front portion of the half-cylinder is perpendicular to a flat upper surface of the base, the top has a right-angle trapezoid shape in a side view as viewed in a direction facing the flat front portion of the half-cylinder,
- wherein the head includes a shoulder between the base and the top,
- wherein the force spring probe and the sense spring probe are disposed so that the apex of the force spring probe and the apex of sense spring probe are oriented adjacent to each other.
Dependencies are inferred from the claim text.