Metrology apparatus
AssigneeRenishaw PLC
InventorsAndrew Geoffrey Butter, Benjamin George Hoy
Life of this patent
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AssigneeRenishaw PLC
InventorsAndrew Geoffrey Butter, Benjamin George Hoy
Estimating the term…
A metrology apparatus includes an indexed articulated joint including: first and second relatively reorientable bodies, respectively having mutually engageable engagement elements, which can be locked together in different angular orientations about a first axis to provide a plurality of angularly indexed positions of the bodies; at least one verification sensor configured to provide a measure of the relative spatial configuration of bodies when in their locked state; and wherein the apparatus is configured such that when the bodies lock together at an indexed position, the sensor measures the relative spatial configuration of the bodies, and wherein information obtained from the measure is compared to calibration information obtained from at least one other measure of the relative spatial configuration of the bodies when the bodies were locked at said indexed position at an earlier point in time, in order to establish information about the state of engagement of the bodies.
A metrology apparatus comprising an indexed articulated joint comprising:
A method of operating a metrology apparatus which comprises an indexed articulated joint comprising first and second bodies respectively having mutually engageable engagement elements, which can be locked together in a plurality of different angular orientations about a first axis so as to provide a plurality of angularly indexed positions at which the first and second bodies can be locked relative to each other, and at least one verification sensor configured to provide an output which is dependent on the relative spatial configuration of first and second bodies in their locked state, the method comprising;
Dependencies are inferred from the claim text.