Semiconductor device comprising oxide semiconductor
AssigneeSemiconductor Energy Laboratory Co., Ltd.
InventorsShunpei Yamazaki, Junichiro Sakata, Hiroki Ohara
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Abstract
A semiconductor device for high power application in which a novel semiconductor material having high mass productivity is provided. An oxide semiconductor film is formed, and then, first heat treatment is performed on the exposed oxide semiconductor film in order to reduce impurities such as moisture or hydrogen in the oxide semiconductor film. Next, in order to further reduce impurities such as moisture or hydrogen in the oxide semiconductor film, oxygen is added to the oxide semiconductor film by an ion implantation method, an ion doping method, or the like, and after that, second heat treatment is performed on the exposed oxide semiconductor film.
Claims2
A semiconductor device comprising:
- a gate electrode;
- an oxide semiconductor film;
- a gate insulating film between the gate electrode and the oxide semiconductor film;
- a source electrode and a drain electrode over the oxide semiconductor film;
- and
- a first insulating film over the source electrode and the drain electrode,
- wherein the oxide semiconductor film comprises In, Ga, and Zn,
- wherein the first insulating film comprises silicon and oxygen,
- wherein the oxide semiconductor film has a crystalline region whose c-axis is oriented in a direction approximately perpendicular to a surface of the oxide semiconductor film,
- wherein the crystalline region exists at a depth of at least 5 nm to 30 nm in a film thickness direction from an interface between the oxide semiconductor film and the first insulating film, and
- wherein the oxide semiconductor film has a region containing microcrystals below the crystalline region.
A semiconductor device comprising:
- a gate electrode;
- an oxide semiconductor film;
- a gate insulating film between the gate electrode and the oxide semiconductor film;
- a source electrode and a drain electrode over the oxide semiconductor film;
- and
- a first insulating film over the source electrode and the drain electrode,
- wherein the oxide semiconductor film comprises In, Ga, and Zn,
- wherein the first insulating film comprises silicon and oxygen,
- wherein the oxide semiconductor film has a crystalline region whose c-axis is oriented in a direction approximately perpendicular to a surface of the oxide semiconductor film,
- wherein the crystalline region exists at a depth of at least 5 nm to 30 nm in a film thickness direction from an interface between the oxide semiconductor film and the first insulating film,
- wherein the oxide semiconductor film has a region containing microcrystals below the crystalline region, and
- wherein a thickness of the oxide semiconductor film is 5 nm or more and 30 nm or less.
Dependencies are inferred from the claim text.