Method for preparing silicon-on-insulator
AssigneeShanghai Institute of Microsystem and Information Technology, Chinese Academy of Sciences
InventorsXing Wei, Ziwen Wang, Rongwang Dai
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AssigneeShanghai Institute of Microsystem and Information Technology, Chinese Academy of Sciences
InventorsXing Wei, Ziwen Wang, Rongwang Dai
Estimating the term…
In a method for preparing silicon-on-insulator, the first etching stop layer, the second etching stop layer, and the device layer are formed bottom-up on the p-type monocrystalline silicon epitaxial substrate, where the first etching stop layer is made of intrinsic silicon, the second etching stop layer is made of germanium-silicon alloy, and the device layer is made of silicon. After oxidation, bonding, reinforcement, and grinding treatment, selective etching is performed. Through a first selective etching to p+/intrinsic silicon, the thickness deviation of the first etching stop layer on the second etching layer is controlled within 100 nm, and then through the second etching and the third etching, the thickness deviation and the surface roughness of the finally prepared silicon-on-insulator film can be optimized to less than 5 nm and less than 4 Å, respectively, so as to realize the flatness of the silicon-on-insulator film.
A method for preparing silicon-on-insulator, comprising:
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