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US 12,593,522 B2Granted
Backside illuminated image sensor and manufacturing method thereof
AssigneeDB HiTek Co., Ltd.
InventorsSang Won Yun, Ju Hwan Jung, Tae Wook Kang
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Abstract
Disclosed are a backside illuminated image sensor and a method of manufacturing the same. More particularly, a backside illuminated image sensor and a method of manufacturing the backside illuminated image sensor include a light scattering portion in a substrate configured to converge a path of incident light to a photoelectric conversion structure, thereby preventing cross-talk between adjacent pixels and increasing light sensitivity.
Claims13
A backside illuminated image sensor comprising:
- a substrate having a front surface and a back surface;
- a photoelectric conversion structure in the substrate, in a unit pixel of the backside illuminated image sensor;
- a wiring region comprising an interlayer insulation film on the front surface of the substrate and a metal wiring layer in the interlayer insulation film;
- an insulation film on the back surface of the substrate;
- a color filter on the insulation film;
- a planarization layer on the color filter;
- a lens on the planarization layer;
- and
- a light scattering portion having an upper surface at the back surface of the substrate, wherein the light scattering portion comprises:
- a center section having a first depth at a center of the unit pixel,
- wherein the center section does not contact the photoelectric conversion structure;
- and
- a plurality of side sections spaced apart from the center section along a lateral direction in the unit pixel, each of the plurality of side sections having a second depth greater than the first depth and a lowermost surface that contacts the photoelectric conversion structure.
10 more elements
Dependencies are inferred from the claim text.