High frequency heterojunction bipolar transistor devices
AssigneeAnalog Devices, Inc.
InventorsF. Jacob Steigerwald, James G. Fiorenza, Guanghai Ding, Susan L. Feindt, Pengfei Wu, Clifford Alan King
Life of this patent
Estimating the term…
Loading patent…
AssigneeAnalog Devices, Inc.
InventorsF. Jacob Steigerwald, James G. Fiorenza, Guanghai Ding, Susan L. Feindt, Pengfei Wu, Clifford Alan King
Estimating the term…
Techniques of integrating lateral HBT devices into a silicon on insulator (SOI) CMOS process. Similar approaches could also be applied to Fin Field-Effect Transistors (FinFETs). A first technique makes use of a CMOS replacement gate process that is typically associated with a partially depleted SOI (PDSOI) or fully depleted SOI (FDSOI) process. A second technique is independent of the CMOS process. Both techniques can accommodate silicon germanium (SiGe) and/or III-V materials, include a self-aligned base contact, and can be used to construct both NPN and PNP transistors with varied peak fT and breakdown voltages.
A lateral heterojunction bipolar transistor device comprising:
A method for fabricating a lateral heterojunction bipolar transistor device, the method comprising:
A lateral heterojunction bipolar transistor device comprising:
Dependencies are inferred from the claim text.