Sample holder and impedance microscope
OwnerToshihiko Ogurainventor
Life of this patent
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Abstract
A sample holder for an impedance microscope according to an aspect includes: a first insulating film having a front surface and a back surface; a second insulating film having a front surface facing the back surface of the first insulating film and a back surface; a conductive film disposed on the front surface of the first insulating film; an electrode disposed to face the back surface of the second insulating film; and a conductive member fixed at a ground potential or a constant potential, in which the conductive member has an opening located between the first insulating film and the electrode.
Claims11
A sample holder for an impedance microscope, the sample holder comprising:
- a first insulating film having a front surface and a back surface;
- a second insulating film having a front surface facing the back surface of the first insulating film and a back surface;
- a conductive film disposed on the front surface of the first insulating film;
- an electrode disposed to face the back surface of the second insulating film;
- and
- a conductive member fixed at a ground potential or a constant potential,
- wherein the conductive member has an opening located between the first insulating film and the electrode.
An impedance microscope comprising:
- a first insulating film having a front surface and a back surface;
- a second insulating film having a front surface facing the back surface of the first insulating film and a back surface, the second insulating film forming a space in which a sample is disposed between the first insulating film and the second insulating film;
- a conductive film disposed on the front surface of the first insulating film;
- an electrode disposed to face the back surface of the second insulating film;
- a conductive member fixed at a ground potential or a constant potential;
- a beam irradiation unit configured to scan the conductive film while irradiating the conductive film with a beam;
- a power supply configured to apply an AC signal to the electrode;
- and
- an image generation unit configured to generate an image of the sample based on the AC signal guided to the conductive film when the AC signal is applied to the electrode while scanning the conductive film with the beam,
- wherein the conductive member has an opening located between the first insulating film and the electrode.
A sample holder for an impedance microscope, the sample holder comprising:
- an electrode coupled to a power supply;
- a first insulating film having a front surface and a back surface;
- a frame member disposed on the front surface of the first insulating film to define an observation window for observing a sample inside the frame member;
- a conductive film in contact with the front surface of the first insulating film inside the frame member;
- a second insulating film disposed between the electrode and the back surface of the first insulating film, the second insulating film forming a housing space in which the sample is disposed between the first insulating film and the second insulating film;
- and
- a conductive member configured to suppress spread of an electric field to outside of the observation window by an electrostatic shielding effect when an AC signal is applied from the power supply to the electrode to form the electric field between the electrode and the conductive film.
Dependencies are inferred from the claim text.